Using Scherrer Equation to Calculate Crystalline Size from X-Ray Diffraction Data of Cement

X-ray diffraction technology (XRD) is one of the fundamental and vital pillars in the study of the properties of crystalline materials. The applications of )XRD( are widely extended in the geological studies and cement researches, especially the investigation of the presence of minerals in rocks and sediments. Crystal size is one of the factors affecting physical properties. The (XRD) device is used to analyze samples of ordinary cement and sulfate-resistant cement, where the mineral phases are determined and the crystal volume is analyzed using the scherrer equation (L= (K*)/*Cos). This equation allows calculating the crystal volume with high accuracy from (XRD) data, which allows a deeper understanding of the internal composition of materials. Moreover, the study shows that the size of the crystals of resistant cement is significantly larger than the size of the crystals of ordinary cement, this is due to slow cooling that leads to the formation of coarse crystals due to the transformation of Tri-calcium silicate (C3S) into bicalcium silicate (C2S), poor storage or the formation of free lime, which affects various heat treatments. The volume can be processed crystallization by controlling the lime saturation coefficient (LSF), raw material quality and furnace temperature control. This study is a crucial step towards improving the quality of cement by controlling the manufacturing conditions and strictly controlling the crystal size that achieves a balance between strength and thermal stability. The results confirm the importance of using the Scherrer equation as an indispensable tool in the analysis of the crystal volume of solids, especially in the cement industry.