Y. Jamil, N., نوفل, M. Salem, ميعاد, M. S. Ismail, and محمد. “The Effect of Radiation on the Electrical Properties of MOS Devices”. Rafidain Journal of Science, vol. 16, no. 2, June 2025, pp. 12-20, doi:10.33899/rjs.2005.41529.